8211
Gamma Reliability Test Times With Minimal Costs and Limited Risks
Arturo J. Fernández
IEEE Transactions on Reliability
71
2
555–563
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8212
Inference of Intensity-Based Models for Load-Sharing Systems With Damage Accumulation
Christine H. Müller, Renate Meyer
IEEE Transactions on Reliability
71
2
539–554
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8213
Service-Oriented Reliability Modeling and Autonomous Optimization of Reliability for Public Cloud Computing Systems
Sa Meng, Liang Luo, Xiwei Qiu, Yuanshun Dai
IEEE Transactions on Reliability
71
2
527–538
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8214
Gated Homogeneous Fusion Networks With Jointed Feature Extraction for Defect Prediction
Dingbang Fang, Shaoying Liu, Ai Liu
IEEE Transactions on Reliability
71
2
512–526
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8215
Production Monitoring to Improve Test Suites
Deepika Tiwari, Long Zhang, Martin Monperrus, Benoit Baudry
IEEE Transactions on Reliability
71
3
1381–1397
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8216
IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation
Antonio Velez-Estevez, Lorena Gutiérrez-Madroñal, Inmaculada Medina-Bulo
IEEE Transactions on Reliability
71
3
1368–1380
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8217
Reliability Evaluation of a Cloud–Fog Computing Network Considering Transmission Mechanisms
Cheng-Fu Huang, Ding-Hsiang Huang, Yi-Kuei Lin
IEEE Transactions on Reliability
71
3
1355–1367
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8218
Progressive Opportunistic Maintenance Policies for Service-Outsourcing Network With Prognostic Updating and Dynamical Optimization
Tangbin Xia, Guojin Si, Dong Wang, Ershun Pan, Lifeng Xi
IEEE Transactions on Reliability
71
3
1340–1354
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8219
How Developers Modify Pull Requests in Code Review
Jing Jiang, Jiangfeng Lv, Jiateng Zheng, Li Zhang
IEEE Transactions on Reliability
71
3
1325–1339
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
8220
Multiclass Classification for Self-Admitted Technical Debt Based on XGBoost
Xin Chen, Dongjin Yu, Xulin Fan, Lin Wang, Jie Chen
IEEE Transactions on Reliability
71
3
1309–1324
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)