771
Global Progress or Local Intent? Exploring Human Perceptions of Communication Strategies in Human-Robot Collaboration
Jialong LI, Shogo MORITA, Wei WANG, Yan ZHANG, Takuto YAMAUCHI, Kenji ...
IEICE Transactions in Information and Systems
108
10
1260–1264
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
772
Knowledge-Enhanced Spatial-Temporal Causal Analysis for Fault Detection of Nickel Top-Blown Furnace Sensors
Dongnian Jiang, Jinjiang Zhao, Dezhi Xu, Huanhuan Ran
IEEE Transactions on Reliability
74
4
5618–5632
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
773
EGTM Data-Driven Aero-Engine Washing Schedule Optimization Using Hybrid Prediction Model
Wenjian Fei, Shenming Zhang, Qifeng Zhou, Yuan Liu, Yishou Wang
IEEE Transactions on Reliability
74
4
5287–5298
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
774
Smart Contract Vulnerability Detection Based on Dual Adversarial Domain Adaptation
Siyu Jiang, Xue Zhang, Zhiwen Xu, Feng Guo, Jiahui Chen, Di Chen
IEEE Transactions on Reliability
74
4
5104–5118
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
775
Intermittent Fault Diagnosis of Dynamic Systems with Model Uncertainty and Disturbance: An Adaptive Nondeterministic Observer Approach
Shigen Gao, Kaibo Zhao
IEEE Transactions on Reliability
74
3
4131–4142
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
776
疲労寿命に及ぼす等2軸荷重の影響：炭素鋼とステンレス鋼の比較
釜谷 昌幸
材料
74
12
741–748
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
777
A Reliability-Aware Replacement Policy for STT-MRAM Caches in Server-Class Processors
Abdollah Mohammadi, Elham Cheshmikhani, Hossein Asadi
IEEE Transactions on Reliability
74
4
4915–4929
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
778
Application of Embedded Stress Sensors for Third-Generation Reliability of Electronic Systems: Validation and Calibration of Mechanical Models in Fan-Out Wafer-Level Packaging
Yuexing Wang, Linwei Cao, Xu He, Kun Liu, Shuairong Deng, Quanfeng Zhou, Xiangyu Sun, Yao Yao
IEEE Transactions on Reliability
74
4
4604–4613
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
779
Resilience Assessment for Hybrid AC/DC Cyber-Physical Power Systems Under Cascading Failures
Kaishun Xiahou, Wei Du, Xingye Xu, Zhenjia Lin, Yang Liu, Zhaoxi Liu, Qiuwei Wu
IEEE Transactions on Reliability
74
3
3442–3453
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
780
Neural topology optimization: the good, the bad, and the ugly
Suryanarayanan Manoj Sanu, Alejandro M. Aragón, Miguel A. Bessa
Structural and Multidisciplinary Optimization
68
10
213–None
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)