751
Iterative Regression Algorithm for Parameter Estimation for Nondestructive One-Shot Devices Under Cyclic Accelerated Life Test With Adaptive Proportion of Failure Design
Wenhan Zhang, Xiaojun Zhu, Mu He, Narayanaswamy Balakrishnan
IEEE Transactions on Reliability
74
4
4692–4703
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
752
Gradient-based optimization of CAD models addressing heterogeneous parameters and composite materials
Martin-Pierre Schmidt, Claus B. W. Pedersen
Structural and Multidisciplinary Optimization
68
10
209–None
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
753
Assessing Embedding Capability of Arrangement Graphs From the Perspectives of Partitioned Edge Faults
Hongbin Zhuang, Chen Guo, Hao Liu, Xiao-Yan Li, Xiaohua Jia
IEEE Transactions on Reliability
74
4
5753–5764
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
754
Reliable-RPL: A Reliability-Aware RPL Protocol Using Trust-Based Blockchain System for Internet of Things
Aswani Devi Aguru, Amrit Pandey, Suresh Babu Erukala, Ali Kashif Bashir, Yaodong Zhu, Rajesh Kaluri, Thippa Reddy Gadekallu
IEEE Transactions on Reliability
74
3
3499–3513
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
755
Mission Abort Policy for Coherent Systems With Heterogeneous Components
Amin Karimi, Mahdi Tavangar, Maxim Finkelstein
IEEE Transactions on Reliability
74
4
4704–4718
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
756
Efficient modeling of stationary interval processes with spline and convolution-based kernels
Chen Li, Feng Wu, Jun Yan
Structural and Multidisciplinary Optimization
68
10
208–None
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
757
Graph-based two-way multi-task Gaussian process model for full-field reconstruction in complex mechanical structures
Yong Pang, Xiwang He, Ziyun Kan
Structural and Multidisciplinary Optimization
68
10
207–None
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
758
DeepFusion: Smart Contract Vulnerability Detection Via Deep Learning and Data Fusion
Hanting Chu, Pengcheng Zhang, Hai Dong, Yan Xiao, Shunhui Ji
IEEE Transactions on Reliability
74
3
3544–3558
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
759
Adaptive Accelerated Degradation Test Design for Tweedie Exponential Dispersion Process With Random Effects Based on the Predictive Remaining Useful Life
Huiling Zheng, Jun Yang, Wenda Kang, Yu Zhao
IEEE Transactions on Reliability
74
4
4885–4899
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)
760
Secure Outsourcing Scheme for Boolean Formulas Truth Assignment Problem
Albert Guan
IEEE Transactions on Reliability
74
4
5095–5103
2025
2.96
平均評価: 0.0 / 5
(0 件のレビュー)