7061
Increasing Validity of Simulation Models Through Metamorphic Testing
Megan Olsen, Mohammad Raunak
IEEE Transactions on Reliability
68
1
91–108
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7062
Mobile GUI Testing Fragility: A Study on Open-Source Android Applications
Riccardo Coppola, Maurizio Morisio, Marco Torchiano
IEEE Transactions on Reliability
68
1
67–90
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7063
Automated Testing of Android Apps: A Systematic Literature Review
Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein
IEEE Transactions on Reliability
68
1
45–66
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7064
Security Testbed for Internet-of-Things Devices
Shachar Siboni, Vinay Sachidananda, Yair Meidan, Michael Bohadana, Yael Mathov, Suhas Bhairav, Asaf Shabtai, Yuval Elovici
IEEE Transactions on Reliability
68
1
23–44
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7065
Toward Better Summarizing Bug Reports With Crowdsourcing Elicited Attributes
He Jiang, Xiaochen Li, Zhilei Ren, Jifeng Xuan, Zhi Jin
IEEE Transactions on Reliability
68
1
2–22
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7066
Imperfect Inspection of a System With Unrevealed Failure and an Unrevealed Defective State
Cristiano A. V. Cavalcante, Philip A. Scarf, M. D. Berrade
IEEE Transactions on Reliability
68
2
764–775
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7067
System Reliability Evaluation Under Dynamic Operating Conditions
Lanqing Hong, Qingqing Zhai, Xin Wang, Zhi-Sheng Ye
IEEE Transactions on Reliability
68
3
800–809
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7068
Optimum Periodic Component Reallocation and System Replacement Maintenance
Yuqiang Fu, Tao Yuan, Xiaoyan Zhu
IEEE Transactions on Reliability
68
2
753–763
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7069
Reliable and Robust Unmanned Aerial Vehicle Wireless Video Transmission
Tao Wang, Zhigao Zheng, Yun Lin, Shihong Yao, Xiao Xie
IEEE Transactions on Reliability
68
3
1050–1060
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7070
A Comprehensive Survey of Prognostics and Health Management Based on Deep Learning for Autonomous Ships
André Listou Ellefsen, Vilmar Æsøy, Sergey Ushakov, Houxiang Zhang
IEEE Transactions on Reliability
68
2
720–740
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)