7051
A Fast and Effective Sensitivity Calculation Method for Circuit Input Vectors
Jie Xiao, Jungang Lou, Jianhui Jiang
IEEE Transactions on Reliability
68
3
938–953
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7052
Dependability Analysis of Data Storage Systems in Presence of Soft Errors
Mostafa Kishani, Mehdi Tahoori, Hossein Asadi
IEEE Transactions on Reliability
68
1
201–215
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7053
Graph-Based Change Detection for Condition Monitoring of Rotating Machines: Techniques for Graph Similarity
Teng Wang, Guoliang Lu, Jie Liu, Peng Yan
IEEE Transactions on Reliability
68
3
1034–1049
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7054
Adaptive Fault Detection and Isolation for Active Suspension Systems With Model Uncertainties
Shuai Yan, Weichao Sun, Fenghua He, Jianyong Yao
IEEE Transactions on Reliability
68
3
927–937
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7055
Time-Variant Reliability-Based Design Optimization Using an Equivalent Most Probable Point
Teng Fang, Chao Jiang, Zhiliang Huang, Xinpeng Wei, Xu Han
IEEE Transactions on Reliability
68
1
175–186
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7056
Start-Up Demonstration Tests With the Intent of Equipment Classification for Balanced Systems
Xian Zhao, Xiaoyue Wang, David W. Coit, Yuan Chen
IEEE Transactions on Reliability
68
1
161–174
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7057
Identification of Cascading Failure Initiated by Hidden Multiple-Branch Contingency
Liang Che, Xuan Liu, Yunfeng Wen, Zuyi Li
IEEE Transactions on Reliability
68
1
149–160
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7058
A Reliability Model for Dependent and Distributed MDS Disk Array Units
Suayb S. Arslan
IEEE Transactions on Reliability
68
1
133–148
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7059
q-Weibull Applied to Brazilian Hydropower Equipment
Edilson Machado de Assis, Gabriel A. Costa Lima, Augusto Prestes, Fernanda Marinho, Luís Augusto Nagasaki Costa
IEEE Transactions on Reliability
68
1
122–132
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
7060
Modeling the Ageing Effect of Cycling Using a Supercapacitor-Module Under High Temperature With Electrochemical Impedance Spectroscopy Test
Hadiza Ahmad, Wong Yee Wan, Dino Isa
IEEE Transactions on Reliability
68
1
109–121
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)