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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
661 An Unsupervised Variable Operating Condition Intelligent Diagnosis Method Based on Fault Feature Recognition in Time–Frequency Images of Rolling Bearings
Pengfei HuangFu, Yingwei Liu, Yuxuan Han, Runlin Chen, Zhiyuan Ma IEEE Transactions on Reliability 74 4 5452–5464 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
662 インサート要素を用いた短繊維複合ゴムの有限要素モデリング手法の開発
林 雅江, 奥田 洋司, 稲垣 和久, 村吉 浩明, 徳田 明彦 日本機械学会論文集 91 951 25–00167 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
663 Multimode Monitoring Method Based on Adaptive Importance Coding Dictionary Learning
Youqing Wang, Mingxing Zheng, Mingliang Cui, Tongze Hou, Jie Zhang, Xin Ma IEEE Transactions on Reliability 74 4 5439–5451 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
664 Assessing Embedding Capability of Arrangement Graphs From the Perspectives of Partitioned Edge Faults
Hongbin Zhuang, Chen Guo, Hao Liu, Xiao-Yan Li, Xiaohua Jia IEEE Transactions on Reliability 74 4 5753–5764 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
665 水平多関節型ロボットの標準作業域内での標準サイクルタイムを短縮する動作軌道の評価法
小木曽 敏夫 日本機械学会論文集 91 951 25–00054 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
666 Knowledge-Enhanced Spatial-Temporal Causal Analysis for Fault Detection of Nickel Top-Blown Furnace Sensors
Dongnian Jiang, Jinjiang Zhao, Dezhi Xu, Huanhuan Ran IEEE Transactions on Reliability 74 4 5618–5632 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
667 Application of Embedded Stress Sensors for Third-Generation Reliability of Electronic Systems: Validation and Calibration of Mechanical Models in Fan-Out Wafer-Level Packaging
Yuexing Wang, Linwei Cao, Xu He, Kun Liu, Shuairong Deng, Quanfeng Zhou, Xiangyu Sun, Yao Yao IEEE Transactions on Reliability 74 4 4604–4613 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
668 Enhancing the Robustness of Speech Anti-Spoofing Countermeasures through Joint Optimization and Transfer Learning
Yikang WANG, Xingming WANG, Chee Siang LEOW, Qishan ZHANG, Ming LI, Hi ... IEICE Transactions in Information and Systems 108 12 1594–1604 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
669 Reliable-RPL: A Reliability-Aware RPL Protocol Using Trust-Based Blockchain System for Internet of Things
Aswani Devi Aguru, Amrit Pandey, Suresh Babu Erukala, Ali Kashif Bashir, Yaodong Zhu, Rajesh Kaluri, Thippa Reddy Gadekallu IEEE Transactions on Reliability 74 3 3499–3513 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
670 Boosting MCTS With Free Energy Minimization
Mawaba Pascal Dao, Adrian M. Peter Neural Computation 37 12 2205–2234 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)