6431
Reliability Assessment of Hierarchical Systems With Incomplete Mixed Data
Rong Pan, Petek Yontay
IEEE Transactions on Reliability
66
4
1036–1047
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6432
Machine Learning Model for Event-Based Prognostics in Gas Circulator Condition Monitoring
Jason J. A. Costello, Graeme M. West, Stephen D. J. McArthur
IEEE Transactions on Reliability
66
4
1048–1057
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6433
Failure Mode and Effect Analysis Using Cloud Model Theory and PROMETHEE Method
Hu-Chen Liu, Zhaojun Li, Wenyan Song, Qiang Su
IEEE Transactions on Reliability
66
4
1058–1072
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6434
A Delay Time Model With Multiple Defect Types and Multiple Inspection Methods
Mohamad Mahmoudi, Alaa Elwany, Kamran Shahanaghi, Mohammad Reza Gholamian
IEEE Transactions on Reliability
66
4
1073–1084
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6435
Pattern Analysis Framework With Graphical Indices for Condition-Based Monitoring
Nishchal Kumar Verma, Rahul Kumar Sevakula, Raghuveer Thirukovalluru
IEEE Transactions on Reliability
66
4
1085–1100
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6436
A State Transfer Scheduling Optimization Framework for Standby Systems
Yan-Hui Lin, Xiao-Yang Li, Rui Kang
IEEE Transactions on Reliability
66
4
1101–1109
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6437
Impact of the Real-Time Thermal Loading on the Bulk Electric System Reliability
Jiashen Teh, Ching-Ming Lai, Yu-Huei Cheng
IEEE Transactions on Reliability
66
4
1110–1119
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6438
A Unified Framework for Evaluating Supply Chain Reliability and Resilience
Xi Chen, Zhimin Xi, Pengyuan Jing
IEEE Transactions on Reliability
66
4
1144–1156
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6439
A Comprehensive Evaluation of Software Rejuvenation Policies for Transaction Systems With Markovian Arrivals
Junjun Zheng, Hiroyuki Okamura, Lin Li, Tadashi Dohi
IEEE Transactions on Reliability
66
4
1157–1177
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
6440
Random Additive Signature Monitoring for Control Flow Error Detection
Jens Vankeirsbilck, Niels Penneman, Hans Hallez, Jeroen Boydens
IEEE Transactions on Reliability
66
4
1178–1192
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)