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631
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Learning to Accelerate Autonomous Driving System Testing
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Haibo Wang, Zhide Zhou, Xiaochen Li, Shikai Guo, He Jiang
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IEEE Transactions on Reliability
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74 |
4 |
4589–4603 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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632
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YOLO-MSD: A Ship Target Detection Algorithm for Maritime Surveillance Scenarios
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Qingxia YANG, Deng PAN, Wanlin HUANG, Erkang CHEN, Bin HUANG, Sentao W ...
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IEICE Transactions in Information and Systems
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108 |
11 |
1373–1380 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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633
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D-Optimal Sample Allocation of the Accelerated Life Tests Under Weibull Series Systems With Type-I Censoring Scheme
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Chih-Ying Tai, Tsai-Hung Fan, Chien-Yu Peng
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IEEE Transactions on Reliability
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74 |
4 |
5335–5346 |
2025 |
1.0
|
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平均評価: 0.0 / 5
(0 件のレビュー)
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634
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Abandonment and Resilience: Understanding Core Developer Turnover in Open-Source Software
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Olivier NOURRY, Masanari KONDO, Shinobu SAITO, Yukako IIMURA, Naoyasu ...
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IEICE Transactions in Information and Systems
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108 |
11 |
1412–1415 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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635
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Interactive Persona Chat for Accurate Response Selection
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Makoto NAKATSUJI, Yasuhiro FUJIWARA
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IEICE Transactions in Information and Systems
|
108 |
12 |
1432–1441 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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636
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Enhancing Reliability and Performance of Deep GnG Monitoring Framework Under Low-Quality Industrial Data
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Zhiqiang Ge
|
IEEE Transactions on Reliability
|
74 |
4 |
5299–5308 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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637
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Extracting Meaningful Issue–Solution Pair From Collaborative Developer Live Chats
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Jiawen Shen, Shikai Guo, Longfeng Chen, Chen Wu, Hui Li, Chenchen Li
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IEEE Transactions on Reliability
|
74 |
3 |
3600–3614 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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638
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日射と長波放射の詳細評価に基づくスラブ軌道断面温度解析手法の提案
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浦川 文寛, 渡辺 勉, 高橋 貴蔵, 渕上 翔太
|
日本機械学会論文集
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91 |
951 |
25–00137 |
2025 |
1.0
|
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平均評価: 0.0 / 5
(0 件のレビュー)
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639
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Functional and Defect Study in Deep Learning Libraries: A Complex Network Perspective
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Xuhui Lu, Zheng Zheng, Fangyun Qin, Xiangyue Ma, Qing Cai
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IEEE Transactions on Reliability
|
74 |
4 |
4900–4914 |
2025 |
1.0
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平均評価: 0.0 / 5
(0 件のレビュー)
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640
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DeepVulMatch: Learning and Matching Latent Vulnerability Representations for Dual-Granularity Vulnerability Detection
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Michael Fu, Trung Le, Van Nguyen, Chakkrit Tantithamthavorn, Dinh Phung
|
IEEE Transactions on Reliability
|
74 |
4 |
4930–4943 |
2025 |
1.0
|
|
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平均評価: 0.0 / 5
(0 件のレビュー)
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