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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
631 Learning to Accelerate Autonomous Driving System Testing
Haibo Wang, Zhide Zhou, Xiaochen Li, Shikai Guo, He Jiang IEEE Transactions on Reliability 74 4 4589–4603 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
632 YOLO-MSD: A Ship Target Detection Algorithm for Maritime Surveillance Scenarios
Qingxia YANG, Deng PAN, Wanlin HUANG, Erkang CHEN, Bin HUANG, Sentao W ... IEICE Transactions in Information and Systems 108 11 1373–1380 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
633 D-Optimal Sample Allocation of the Accelerated Life Tests Under Weibull Series Systems With Type-I Censoring Scheme
Chih-Ying Tai, Tsai-Hung Fan, Chien-Yu Peng IEEE Transactions on Reliability 74 4 5335–5346 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
634 Abandonment and Resilience: Understanding Core Developer Turnover in Open-Source Software
Olivier NOURRY, Masanari KONDO, Shinobu SAITO, Yukako IIMURA, Naoyasu ... IEICE Transactions in Information and Systems 108 11 1412–1415 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
635 Interactive Persona Chat for Accurate Response Selection
Makoto NAKATSUJI, Yasuhiro FUJIWARA IEICE Transactions in Information and Systems 108 12 1432–1441 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
636 Enhancing Reliability and Performance of Deep GnG Monitoring Framework Under Low-Quality Industrial Data
Zhiqiang Ge IEEE Transactions on Reliability 74 4 5299–5308 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
637 Extracting Meaningful Issue–Solution Pair From Collaborative Developer Live Chats
Jiawen Shen, Shikai Guo, Longfeng Chen, Chen Wu, Hui Li, Chenchen Li IEEE Transactions on Reliability 74 3 3600–3614 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
638 日射と長波放射の詳細評価に基づくスラブ軌道断面温度解析手法の提案
浦川 文寛, 渡辺 勉, 高橋 貴蔵, 渕上 翔太 日本機械学会論文集 91 951 25–00137 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
639 Functional and Defect Study in Deep Learning Libraries: A Complex Network Perspective
Xuhui Lu, Zheng Zheng, Fangyun Qin, Xiangyue Ma, Qing Cai IEEE Transactions on Reliability 74 4 4900–4914 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
640 DeepVulMatch: Learning and Matching Latent Vulnerability Representations for Dual-Granularity Vulnerability Detection
Michael Fu, Trung Le, Van Nguyen, Chakkrit Tantithamthavorn, Dinh Phung IEEE Transactions on Reliability 74 4 4930–4943 2025 1.0
平均評価: 0.0 / 5 (0 件のレビュー)