Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
5961 Deviation-Based Obfuscation-Resilient Program Equivalence Checking With Application to Software Plagiarism Detection
Jiang Ming, Fangfang Zhang, Dinghao Wu, Peng Liu, Sencun Zhu IEEE Transactions on Reliability 65 4 1647–1664 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5962 Characterizing Direct Monitoring Techniques in Software Systems
Marcello Cinque, Domenico Cotroneo, Raffaele Della Corte, Antonio Pecchia IEEE Transactions on Reliability 65 4 1665–1681 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5963 Eliminating Redundant Bounds Checks in Dynamic Buffer Overflow Detection Using Weakest Preconditions
Yulei Sui, Ding Ye, Yu Su, Jingling Xue IEEE Transactions on Reliability 65 4 1682–1699 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5964 The Reliability Analysis Based on Subsystems of (n,k) -Star Graph
Xiaowang Li, Shuming Zhou, Xiang Xu, Limei Lin, Dajin Wang IEEE Transactions on Reliability 65 4 1700–1709 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5965 Improve the Accuracy of Asymptotic Approximation in Reliability Problems Involving Multimodal Distributions
Jingjing He, Xuefei Guan, Ratneshwar Jha IEEE Transactions on Reliability 65 4 1724–1736 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5966 Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Piao Chen, Ancha Xu, Zhi-Sheng Ye IEEE Transactions on Reliability 65 4 1737–1744 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5967 A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
Jian-Fei Zheng, Xiao-Sheng Si, Chang-Hua Hu, Zheng-Xin Zhang, Wei Jiang IEEE Transactions on Reliability 65 2 736–750 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5968 Online Performance Assessment Method for a Model-Based Prognostic Approach
Yang Hu, Piero Baraldi, Francesco Di Maio, Enrico Zio IEEE Transactions on Reliability 65 2 718–735 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5969 Method of Computer-Aided Fault Tree Analysis for High-Reliable and Safety Design
Youji Hiraoka, Tamotsu Murakami, Katsunari Yamamoto, Yoshiyuki Furukawa, Hiroyuki Sawada IEEE Transactions on Reliability 65 2 687–703 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5970 Defense of High-Speed Rail With an Evolutionary Algorithm Guided by Game Theory
Lance Fiondella, Ashrafur Rahman, Nicholas Lownes, Veeresh Varad Basavaraj IEEE Transactions on Reliability 65 2 674–686 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)