5611
Secure and Dependable NoC-Connected Systems on an FPGA Chip
Taimour Wehbe, Xiaofang Wang
IEEE Transactions on Reliability
65
4
1852–1863
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5612
On Ageing Concepts for Repairable Items From Heterogeneous Populations
Ji Hwan Cha, Maxim Finkelstein
IEEE Transactions on Reliability
65
4
1864–1870
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5613
Formal Verification With Confidence Intervals to Establish Quality of Service Properties of Software Systems
Radu Calinescu, Carlo Ghezzi, Kenneth Johnson, Mauro Pezzé, Yasmin Rafiq, Giordano Tamburrelli
IEEE Transactions on Reliability
65
1
107–125
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5614
Integrating Animation-Based Inspection Into Formal Design Specification Construction for Reliable Software Systems
Mo Li, Shaoying Liu
IEEE Transactions on Reliability
65
1
88–106
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5615
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Antonio J. Sanchez-Clemente, Luis Entrena, Radek Hrbacek, Lukas Sekanina
IEEE Transactions on Reliability
65
4
1871–1883
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5616
Recovery From Software Failures Caused by Mandelbugs
Michael Grottke, Dong Seong Kim, Rajesh Mansharamani, Manoj Nambiar, Roberto Natella, Kishor S. Trivedi
IEEE Transactions on Reliability
65
1
70–87
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5617
Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction
Wangshu Liu, Shulong Liu, Qing Gu, Jiaqiang Chen, Xiang Chen, Daoxu Chen
IEEE Transactions on Reliability
65
1
38–53
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5618
Measuring the Diversity of a Test Set With Distance Entropy
Qingkai Shi, Zhenyu Chen, Chunrong Fang, Yang Feng, Baowen Xu
IEEE Transactions on Reliability
65
1
19–27
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5619
Clustering Deviations for Black Box Regression Testing of Database Applications
Erik Rogstad, Lionel C. Briand
IEEE Transactions on Reliability
65
1
4–18
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5620
Special Section on Software Quality Assurance: Research and Practice
W. Eric Wong
IEEE Transactions on Reliability
65
1
3–3
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)