5601
Bivariate Analysis of Incomplete Degradation Observations Based on Inverse Gaussian Processes and Copulas
Weiwen Peng, Yan-Feng Li, Yuan-Jian Yang, Shun-Peng Zhu, Hong-Zhong Huang
IEEE Transactions on Reliability
65
2
624–639
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5602
Planning Repeated Degradation Testing for Products With Three-Source Variability
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu
IEEE Transactions on Reliability
65
2
640–647
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5603
A Generalized Griffith Importance Measure for Components With Multiple State Transitions
Yan Liu, Shubin Si, Lirong Cui, Zheng Wang, Shudong Sun
IEEE Transactions on Reliability
65
2
662–673
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5604
The Reliability Analysis Based on Subsystems of (n,k) -Star Graph
Xiaowang Li, Shuming Zhou, Xiang Xu, Limei Lin, Dajin Wang
IEEE Transactions on Reliability
65
4
1700–1709
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5605
Improve the Accuracy of Asymptotic Approximation in Reliability Problems Involving Multimodal Distributions
Jingjing He, Xuefei Guan, Ratneshwar Jha
IEEE Transactions on Reliability
65
4
1724–1736
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5606
Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Piao Chen, Ancha Xu, Zhi-Sheng Ye
IEEE Transactions on Reliability
65
4
1737–1744
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5607
Cascading Failures on Reliability in Cyber-Physical System
Zuyuan Zhang, Wei An, Fangming Shao
IEEE Transactions on Reliability
65
4
1745–1754
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5608
Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM
Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao
IEEE Transactions on Reliability
65
4
1755–1768
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5609
Collective Personalized Change Classification With Multiobjective Search
Xin Xia, David Lo, Xinyu Wang, Xiaohu Yang
IEEE Transactions on Reliability
65
4
1810–1829
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5610
Network Nodal Independence, Hierarchical Path Search, and Model Reuse for Network Availability Computation
Jason W. Rupe
IEEE Transactions on Reliability
65
4
1842–1851
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)