5451
Probabilistic Risk Assessment of Station Blackouts in Nuclear Power Plants
Hindolo George-Williams, Min Lee, Edoardo Patelli
IEEE Transactions on Reliability
67
2
494–512
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5452
A Novel Approach to Modeling and Verifying Real-Time Systems for High Reliability
Jin Cui, Zhenhua Duan, Cong Tian, Hongwei Du
IEEE Transactions on Reliability
67
2
481–493
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5453
The Inverse Nakagami-m Distribution: A Novel Approach in Reliability
Francisco Louzada, Pedro Luiz Ramos, Diego Nascimento
IEEE Transactions on Reliability
67
3
1030–1042
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5454
ConfVD: System Reactions Analysis and Evaluation Through Misconfiguration Injection
Shanshan Li, Wang Li, Xiangke Liao, Shaoliang Peng, Shulin Zhou, Zhouyang Jia, Teng Wang
IEEE Transactions on Reliability
67
4
1393–1405
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5455
Evaluation of Mutation Testing in a Nuclear Industry Case Study
Pedro Delgado-Pérez, Ibrahim Habli, Steve Gregory, Rob Alexander, John Clark, Inmaculada Medina-Bulo
IEEE Transactions on Reliability
67
4
1406–1419
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5456
A Deductive Method for Diagnostic Analysis of Digital Instrumentation and Control Systems
Jun Yang, Tunc Aldemir, Carol Smidts
IEEE Transactions on Reliability
67
4
1442–1458
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5457
Stochastic Process for the Availability Assessment of Single-Feeder Industrial Energy System Sections
Tom Van Acker, Dirk Van Hertem
IEEE Transactions on Reliability
67
4
1459–1467
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5458
An Optimal Reprofiling Policy for High-Speed Train Wheels Subject to Wear and External Shocks Using a Semi-Markov Decision Process
E. Mingcheng, Bing Li, Zengqiang Jiang, Qi Li
IEEE Transactions on Reliability
67
4
1468–1481
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5459
Automatic Testing of Design Faults in MapReduce Applications
Jesús Morán, Antonia Bertolino, Claudio de la Riva, Javier Tuya
IEEE Transactions on Reliability
67
3
717–732
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5460
A Machine-Learning-Driven Evolutionary Approach for Testing Web Application Firewalls
Dennis Appelt, Cu D. Nguyen, Annibale Panichella, Lionel C. Briand
IEEE Transactions on Reliability
67
3
733–757
2018
1.0
平均評価: 0.0 / 5
(0 件のレビュー)