5231
Failure Mode and Effect Analysis Using Cloud Model Theory and PROMETHEE Method
Hu-Chen Liu, Zhaojun Li, Wenyan Song, Qiang Su
IEEE Transactions on Reliability
66
4
1058–1072
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5232
A Delay Time Model With Multiple Defect Types and Multiple Inspection Methods
Mohamad Mahmoudi, Alaa Elwany, Kamran Shahanaghi, Mohammad Reza Gholamian
IEEE Transactions on Reliability
66
4
1073–1084
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5233
Pattern Analysis Framework With Graphical Indices for Condition-Based Monitoring
Nishchal Kumar Verma, Rahul Kumar Sevakula, Raghuveer Thirukovalluru
IEEE Transactions on Reliability
66
4
1085–1100
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5234
Weighted Voting System With Unreliable Links
Qiang Liu, Hailin Zhang
IEEE Transactions on Reliability
66
2
339–350
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5235
Impact of the Real-Time Thermal Loading on the Bulk Electric System Reliability
Jiashen Teh, Ching-Ming Lai, Yu-Huei Cheng
IEEE Transactions on Reliability
66
4
1110–1119
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5236
A Unified Framework for Evaluating Supply Chain Reliability and Resilience
Xi Chen, Zhimin Xi, Pengyuan Jing
IEEE Transactions on Reliability
66
4
1144–1156
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5237
A Comprehensive Evaluation of Software Rejuvenation Policies for Transaction Systems With Markovian Arrivals
Junjun Zheng, Hiroyuki Okamura, Lin Li, Tadashi Dohi
IEEE Transactions on Reliability
66
4
1157–1177
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5238
Random Additive Signature Monitoring for Control Flow Error Detection
Jens Vankeirsbilck, Niels Penneman, Hans Hallez, Jeroen Boydens
IEEE Transactions on Reliability
66
4
1178–1192
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5239
Constraint Handling in NSGA-II for Solving Optimal Testing Resource Allocation Problems
Guofu Zhang, Zhaopin Su, Miqing Li, Feng Yue, Jianguo Jiang, Xin Yao
IEEE Transactions on Reliability
66
4
1193–1212
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5240
Code Coverage and Postrelease Defects: A Large-Scale Study on Open Source Projects
Pavneet Singh Kochhar, David Lo, Julia Lawall, Nachiappan Nagappan
IEEE Transactions on Reliability
66
4
1213–1228
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)