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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
5221 Accuracy Graphs of Spectrum-Based Fault Localization Formulas
Chung Man Tang, W. K. Chan, Yuen Tak Yu, Zhenyu Zhang IEEE Transactions on Reliability 66 2 403–424 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5222 A Similarity Metric for the Inputs of OO Programs and Its Application in Adaptive Random Testing
Jinfu Chen, Fei-Ching Kuo, Tsong Yueh Chen, Dave Towey, Chenfei Su, Rubing Huang IEEE Transactions on Reliability 66 2 373–402 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5223 The Impact of Soft Error Event Topography on the Reliability of Computer Memories
Christopher Ogden, Michael Mascagni IEEE Transactions on Reliability 66 4 966–979 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5224 Optimization of Component Allocation/Distribution and Sequencing in Warm Standby Series-Parallel Systems
Gregory Levitin, Liudong Xing, Yuanshun Dai IEEE Transactions on Reliability 66 4 980–988 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5225 Accelerated Life Testing With Semiparametric Modeling of Stress Effects
Wujun Si, Qingyu Yang IEEE Transactions on Reliability 66 4 989–996 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5226 Optimal Sequential ALT Plans for Systems With Mixture of One-Shot Units
Yao Cheng, Elsayed A. Elsayed IEEE Transactions on Reliability 66 4 997–1011 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5227 The Song Rule as a Validator of Analytical Results—A Note Correcting System Reliability Results in a Review of the Literature
Wheyming Tina Song IEEE Transactions on Reliability 66 4 1012–1024 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5228 Comparing Residual Lives and Inactivity Times by Transform Stochastic Orders
Antonio Arriaza, Miguel A. Sordo, Alfonso Suárez-Llorens IEEE Transactions on Reliability 66 2 366–372 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5229 Reliability Assessment of Hierarchical Systems With Incomplete Mixed Data
Rong Pan, Petek Yontay IEEE Transactions on Reliability 66 4 1036–1047 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5230 Machine Learning Model for Event-Based Prognostics in Gas Circulator Condition Monitoring
Jason J. A. Costello, Graeme M. West, Stephen D. J. McArthur IEEE Transactions on Reliability 66 4 1048–1057 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)