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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
5211 Maintenance Policies for a Deteriorating System Subject to Non-Self-Announcing Failures
Mimi Zhang, Matthew Revie IEEE Transactions on Reliability 66 1 219–232 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5212 A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing
Mohamad Imran Bandan, Samuel Pagliarini, Jimson Mathew, Dhiraj Pradhan IEEE Transactions on Reliability 66 1 245–256 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5213 Improved Multiple Faults-Aware Placement Strategy: Reducing the Overheads and Error Rates in Digital Circuits
Büşra Keleş, Salih Tekin, Niyazi Onur Bakır IEEE Transactions on Reliability 66 1 233–244 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5214 Optimal Periodic Inspections and Activation Sequencing Policy in Standby Systems With Condition-Based Mode Transfer
Zhenxu Zhou, Qin Zhang IEEE Transactions on Reliability 66 1 189–201 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5215 Model Event/Fault Trees With Dynamic Uncertain Causality Graph for Better Probabilistic Safety Assessment
Simon Kennedy, Mehmet Rasit Yuce, Jean-Michel Redouté IEEE Transactions on Reliability 66 1 178–188 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5216 Evaluation of Conducted Emission Test Methods for Charge Pump DC/DC Converters
Wei Hong, Shaoping Wang, Mileta M. Tomovic, Haokuo Liu, Jian Shi, Xingjian Wang IEEE Transactions on Reliability 66 1 170–177 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5217 A Novel Indicator for Mechanical Failure and Life Prediction Based on Debris Monitoring
Zhaohui Cen, Paul Stewart IEEE Transactions on Reliability 66 1 161–169 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5218 Condition Parameter Estimation for Photovoltaic Buck Converters Based on Adaptive Model Observers
Mingyang Li, Weidong Zhang, Qingpei Hu, Huairui Guo, Jian Liu IEEE Transactions on Reliability 66 1 148–160 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5219 Optimal Time Interval Between Periodic Inspections for a Two-Component Cold Standby Multistate System
Angélica Alebrant Mendes, José Luis Duarte Ribeiro, David W. Coit IEEE Transactions on Reliability 66 2 559–574 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5220 A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies
Bodapati Srinivasu, K. Sridharan IEEE Transactions on Reliability 66 2 440–457 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)