5031
Planning Repeated Degradation Testing for Products With Three-Source Variability
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu
IEEE Transactions on Reliability
65
2
640–647
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5032
On Ageing Concepts for Repairable Items From Heterogeneous Populations
Ji Hwan Cha, Maxim Finkelstein
IEEE Transactions on Reliability
65
4
1864–1870
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5033
Secure and Dependable NoC-Connected Systems on an FPGA Chip
Taimour Wehbe, Xiaofang Wang
IEEE Transactions on Reliability
65
4
1852–1863
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5034
Network Nodal Independence, Hierarchical Path Search, and Model Reuse for Network Availability Computation
Jason W. Rupe
IEEE Transactions on Reliability
65
4
1842–1851
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5035
Model-Based Fault Diagnosis of a Planetary Gear: A Novel Approach Using Transmission Error
Jungho Park, Jong Moon Ha, Hyunseok Oh, Byeng D. Youn, Joo-Ho Choi, Nam Ho Kim
IEEE Transactions on Reliability
65
4
1830–1841
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5036
A Generalized Griffith Importance Measure for Components With Multiple State Transitions
Yan Liu, Shubin Si, Lirong Cui, Zheng Wang, Shudong Sun
IEEE Transactions on Reliability
65
2
662–673
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5037
Defense of High-Speed Rail With an Evolutionary Algorithm Guided by Game Theory
Lance Fiondella, Ashrafur Rahman, Nicholas Lownes, Veeresh Varad Basavaraj
IEEE Transactions on Reliability
65
2
674–686
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5038
Collective Personalized Change Classification With Multiobjective Search
Xin Xia, David Lo, Xinyu Wang, Xiaohu Yang
IEEE Transactions on Reliability
65
4
1810–1829
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5039
Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM
Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao
IEEE Transactions on Reliability
65
4
1755–1768
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
5040
Fracture of a multiferroic semicylinder with a magnetoelectroelastic interlayer: Piezoelectric stiffening/softening effects and peak removal of stress intensity factor
Shi-Lun Liu, Yong-Dong Li
International Journal of Solids and Structures
88
None
110–118
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)