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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
481 Multi-Label Semantic Segmentation for Mathematical Expressions Detection in Document Images
Duc-Dung NGUYEN IEICE Transactions in Information and Systems 108 10 1279–1282 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
482 Optimal Designs of Multiple Step-Stress Accelerated Life Tests for One-Shot Devices With Weibull Lifetime Distributions
Man Ho Ling IEEE Transactions on Reliability 74 3 3017–3027 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
483 Cross-Modal Deep Interaction and Semantic Aligning for Image-Text Retrieval
Ruidong CHEN, Baohua QIANG, Xianyi YANG, Shihao ZHANG, Yuan XIE IEICE Transactions in Information and Systems 108 10 1230–1238 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
484 FNS-CATF-CAC: An Efficient Crosstalk Avoidance Code to Reduce the Switching Activity in TSV Arrays
Chen Wei, Xiaole Cui IEEE Transactions on Reliability 74 3 3856–3870 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
485 Spectral-Domain Augmentation for Cover Song Identification
Jinsoo SEO IEICE Transactions in Information and Systems 108 10 1287–1291 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
486 Cross-Domain Acoustic Diagnosis Method of Rotating Machinery Based on Vibration and Acoustic Migration
Peng Wu, Gongye Yu, Yongming Han, Bo Ma IEEE Transactions on Reliability 74 3 3769–3783 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
487 Multi-criteria decision-making based on game theoretic approach for materials selection strategy in optical remote sensor
Wang Jianing, Xue Zhipeng, Liu Chang Structural and Multidisciplinary Optimization 68 11 226–None 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
488 Predictive Maintenance Edge Artificial Intelligence Application Study Using Recurrent Neural Networks for Early Aging Detection in Peristaltic Pumps
Juan M. Montes-Sánchez, Yoko Uwate, Yoshifumi Nishio, Saturnino Vicente-Díaz, Ángel Jiménez-Fernández IEEE Transactions on Reliability 74 3 3730–3744 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
489 A Novel Two-Stage Algorithm for Assessing System Reliability of a Multistate Sustainable Supply Chain
Kuan-Yu Lin, Yi-Kuei Lin IEEE Transactions on Reliability 74 3 4280–4293 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
490 Integrated Temperature and Stress Sensors in Fan-Out Wafer-Level Packaging to Better Achieve the Third-Generation Reliability of Electronic Systems
Linwei Cao, Yuexing Wang, Kun Liu, Xiangou Zhang, Shuairong Deng, Quanfeng Zhou, Xiangyu Sun, Wanli Zhang IEEE Transactions on Reliability 74 3 4020–4031 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)