461
日射と長波放射の詳細評価に基づくスラブ軌道断面温度解析手法の提案
浦川 文寛, 渡辺 勉, 高橋 貴蔵, 渕上 翔太
日本機械学会論文集
91
951
25–00137
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
462
Unveiling the Security Risks in Default Wi-Fi Passwords of Consumer-Grade Routers
Takahiro KASAMA, Ryoichi ISAWA, Ryo KAMINO, Yuichi HAGIWARA
IEICE Transactions in Information and Systems
108
12
1473–1483
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
463
Interactive Persona Chat for Accurate Response Selection
Makoto NAKATSUJI, Yasuhiro FUJIWARA
IEICE Transactions in Information and Systems
108
12
1432–1441
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
464
Reliability Modeling Analysis and Uncertainty Quantification Method for Electronic Systems With Multireliability Dependency
Yanfang Wang, Ying Chen, Yingyi Li, Rui Kang
IEEE Transactions on Reliability
74
4
4760–4774
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
465
脚支援システムへの応用を考慮した搭乗型手動制御試験システムのレバー操作方法の検証
北山 文矢, 近藤 良
日本機械学会論文集
91
951
25–00056
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
466
An Ensemble Data-Model-Label Three-Level Regularization Framework for Imbalanced Intelligent Fault Diagnosis
Yixiong Luo, Jianhua Shi, Jinbiao Tan, Zijie Ren, Jiafu Wan, Mejdl Safran, Salman A. AlQahtani
IEEE Transactions on Reliability
74
3
3884–3896
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
467
SAT-Based Differential Analysis of Initialization Phase of AEGIS/Tiaoxin-346/Rocca/Rocca-S
Takuro SHIRAYA, Kosei SAKAMOTO, Takanori ISOBE
IEICE Transactions in Information and Systems
108
12
1507–1525
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
468
Completion of Phrase-Based Concepts in Vulnerability Descriptions Through 1-Hop Relationship
Linyi Han, Dongshun He, Xiaowang Zhang, Zhiyong Feng
IEEE Transactions on Reliability
74
4
4473–4487
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
469
Aircraft Engine Remaining Useful Life Estimation via a Graph Attention Reconcile Network Model Based on Physical Equations and Sensor Data
Wenyue Cui, Shuo Zhang, Tao Sun, Rui Wang
IEEE Transactions on Reliability
74
4
5244–5258
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)
470
Semantic Structure Invariance-Based Metamorphic Testing for Machine Translation Systems
Chang-ai Sun, Jian Mu, Mingjun Xiao, Huai Liu, Pinjia He
IEEE Transactions on Reliability
74
3
3251–3265
2025
3.92
平均評価: 0.0 / 5
(0 件のレビュー)