24651
An Approach for Identifying and Analyzing Implicit Interactions in Distributed Systems
Jason Jaskolka, John Villasenor
IEEE Transactions on Reliability
66
2
529–546
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24652
A Scheme to Reduce the Number of Parity Check Bits in Orthogonal Latin Square Codes
Pedro Reviriego, Shanshan Liu, Alfonso Sánchez-Macián, Liyi Xiao, Juan Antonio Maestro
IEEE Transactions on Reliability
66
2
518–528
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24653
A Copula-Based Trend-Renewal Process Model for Analysis of Repairable Systems With Multitype Failures
Qingyu Yang, Yili Hong, Nailong Zhang, Jie Li
IEEE Transactions on Reliability
66
3
590–602
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24654
Model Uncertainty in Accelerated Degradation Testing Analysis
Le Liu, Xiao-Yang Li, Enrico Zio, Rui Kang, Tong-Min Jiang
IEEE Transactions on Reliability
66
3
603–615
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24655
Inference for Multicomponent Systems With Dependent Failures
Richard Arnold, Stefanka Chukova, Yu Hayakawa
IEEE Transactions on Reliability
66
3
616–629
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24656
Mixed Nonprobabilistic Reliability-Based Optimization Method for Heat Transfer System With Fuzzy and Interval Parameters
Chong Wang, Zhiping Qiu, Menghui Xu, Yunlong Li
IEEE Transactions on Reliability
66
3
630–640
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24657
Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data
Man Ho Ling, Narayanaswamy Balakrishnan
IEEE Transactions on Reliability
66
3
641–650
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24658
A Single-Loop Approach for Time-Variant Reliability-Based Design Optimization
Zhi Liang Huang, Chao Jiang, Xiao Ming Li, Xin Peng Wei, Teng Fang, Xu Han
IEEE Transactions on Reliability
66
3
651–661
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24659
Nonparametric Bayesian Analysis for Masked Data From Hybrid Systems in Accelerated Lifetime Tests
Bin Liu, Yimin Shi, Jing Cai, Xuchao Bai, Chunfang Zhang
IEEE Transactions on Reliability
66
3
662–676
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24660
Project Reliability Interval for a Stochastic Project Network Subject to Time and Budget Constraints
Yi-Kuei Lin, Cheng-Fu Huang, Louis Cheng-Lu Yeng, Yun-Ling Cho
IEEE Transactions on Reliability
66
3
689–699
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)