24641
Sensory-Based Failure Threshold Estimation for Remaining Useful Life Prediction
Abdallah Chehade, Scott Bonk, Kaibo Liu
IEEE Transactions on Reliability
66
3
939–949
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24642
An Empirical Study on the Effect of Testing on Code Quality Using Topic Models: A Case Study on Software Development Systems
Tse-Hsun Chen, Stephen W. Thomas, Hadi Hemmati, Meiyappan Nagappan, Ahmed E. Hassan
IEEE Transactions on Reliability
66
3
806–824
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24643
Software Engineering of Safety-Critical Systems: Themes From Practitioners
Phillip A. Laplante, Joanna F. DeFranco
IEEE Transactions on Reliability
66
3
825–836
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24644
Combined Redundancy Allocation and Maintenance Planning Using a Two-Stage Stochastic Programming Model for Multiple Component Systems
Xiaoqiang Bei, Nida Chatwattanasiri, David W. Coit, Xiaoyan Zhu
IEEE Transactions on Reliability
66
3
950–962
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24645
Prognostic Algorithms for Flaw Growth Prediction in an Aircraft Wing
Waleed Bin Yousuf, Tariq Khan, Taha Ali
IEEE Transactions on Reliability
66
2
478–486
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24646
Availability Model of a PHM-Equipped Component
Michele Compare, Luca Bellani, Enrico Zio
IEEE Transactions on Reliability
66
2
487–501
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24647
Design and Risk Evaluation of Reliability Demonstration Test for Hierarchical Systems With Multilevel Information Aggregation
Fumio Machida, Jianwen Xiang, Kumiko Tadano, Yoshiharu Maeno
IEEE Transactions on Reliability
66
1
135–147
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24648
Inference for Constant-Stress Accelerated Life Tests With Dependent Competing Risks From Bivariate Birnbaum–Saunders Distribution Based on Adaptive Progressively Hybrid Censoring
Mohammadsadegh Mobin, Zhaojun Li, Ghorbanmohammad Komaki
IEEE Transactions on Reliability
66
1
111–122
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24649
Combining Models for Improved Fault Localization in Spreadsheets
Jeffrey Stuckman, James Walden, Riccardo Scandariato
IEEE Transactions on Reliability
66
1
38–53
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
24650
The Effect of Dimensionality Reduction on Software Vulnerability Prediction Models
Sagar Sen, Dusica Marijan, Carlo Ieva, Astrid Grime, Atle Sander
IEEE Transactions on Reliability
66
1
17–37
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)