23211
Model Uncertainty in Accelerated Degradation Testing Analysis
Le Liu, Xiao-Yang Li, Enrico Zio, Rui Kang, Tong-Min Jiang
IEEE Transactions on Reliability
66
3
603–615
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23212
A Copula-Based Trend-Renewal Process Model for Analysis of Repairable Systems With Multitype Failures
Qingyu Yang, Yili Hong, Nailong Zhang, Jie Li
IEEE Transactions on Reliability
66
3
590–602
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23213
Design and Risk Evaluation of Reliability Demonstration Test for Hierarchical Systems With Multilevel Information Aggregation
Fumio Machida, Jianwen Xiang, Kumiko Tadano, Yoshiharu Maeno
IEEE Transactions on Reliability
66
1
135–147
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23214
Inference for Constant-Stress Accelerated Life Tests With Dependent Competing Risks From Bivariate Birnbaum–Saunders Distribution Based on Adaptive Progressively Hybrid Censoring
Mohammadsadegh Mobin, Zhaojun Li, Ghorbanmohammad Komaki
IEEE Transactions on Reliability
66
1
111–122
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23215
Combining Models for Improved Fault Localization in Spreadsheets
Jeffrey Stuckman, James Walden, Riccardo Scandariato
IEEE Transactions on Reliability
66
1
38–53
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23216
The Effect of Dimensionality Reduction on Software Vulnerability Prediction Models
Sagar Sen, Dusica Marijan, Carlo Ieva, Astrid Grime, Atle Sander
IEEE Transactions on Reliability
66
1
17–37
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23217
Optimal Scheduling and Management on Correlating Reliability, Performance, and Energy Consumption for Multiagent Cloud Systems
Peng Sun, Yuanshun Dai, Xiwei Qiu
IEEE Transactions on Reliability
66
2
547–558
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23218
An Approach for Identifying and Analyzing Implicit Interactions in Distributed Systems
Jason Jaskolka, John Villasenor
IEEE Transactions on Reliability
66
2
529–546
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23219
A Scheme to Reduce the Number of Parity Check Bits in Orthogonal Latin Square Codes
Pedro Reviriego, Shanshan Liu, Alfonso Sánchez-Macián, Liyi Xiao, Juan Antonio Maestro
IEEE Transactions on Reliability
66
2
518–528
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
23220
Dynamic Optimization of Process Quality Control and Maintenance Planning
Amit Kumar Jain, Bhupesh Kumar Lad
IEEE Transactions on Reliability
66
2
502–517
2017
1.0
平均評価: 0.0 / 5
(0 件のレビュー)