17121
k-Terminal Reliability of Ad Hoc Networks Considering the Impacts of Node Failures and Interference
Shihu Xiang, Jun Yang
IEEE Transactions on Reliability
69
2
725–739
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17122
An FTA Method for the Unavailability of Supply in Gas Networks Supported by Physical Models
Blaže Gjorgiev, Andrea Antenucci, Andrija Volkanovski, Giovanni Sansavini
IEEE Transactions on Reliability
69
2
740–753
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17123
Entropy Based Fault Classification Using the Case Western Reserve University Data: A Benchmark Study
Yongbo Li, Xianzhi Wang, Shubin Si, Shiqian Huang
IEEE Transactions on Reliability
69
2
754–767
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17124
Nonlinear-Drifted Fractional Brownian Motion With Multiple Hidden State Variables for Remaining Useful Life Prediction of Lithium-Ion Batteries
Heng Zhang, Zhenling Mo, Jianyu Wang, Qiang Miao
IEEE Transactions on Reliability
69
2
768–780
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17125
A Hybrid Condition-Based Maintenance Model for Deteriorating Systems Subject to Nonmemoryless Imperfect Repairs and Perfect Replacements
Khac Tuan Huynh
IEEE Transactions on Reliability
69
2
781–815
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17126
A Generic Framework for Generalized Virtual Age Models
Laurent Doyen, Rémy Drouilhet, Léa Brenière
IEEE Transactions on Reliability
69
2
816–832
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17127
Aging Mitigation in FPGAs Considering Delay, Power, and Temperature
Mohammad Hadi Mottaghi, Mehdi Sedighi, Morteza Saheb Zamani
IEEE Transactions on Reliability
69
2
833–844
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17128
LSCDroid: Malware Detection Based on Local Sensitive API Invocation Sequences
Fei Wang, Zhi-Bin Yang, Zhi-Qiu Huang, Cheng-Wei Liu, Yong Zhou, Jean-Paul Bodeveix, Mamoun Filali
IEEE Transactions on Reliability
69
1
174–187
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17129
DIAVA: A Traffic-Based Framework for Detection of SQL Injection Attacks and Vulnerability Analysis of Leaked Data
Weiping Wang, Jianjian Wei, Shigeng Zhang, Xi Luo
IEEE Transactions on Reliability
69
1
188–202
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
17130
Hierarchical Analysis of Loops With Relaxed Abstract Transformers
Haifeng Gu, Jianning Zhang, Tian Liu, Ming Hu, Junlong Zhou, Tongquan Wei, Mingsong Chen
IEEE Transactions on Reliability
69
1
203–215
2020
1.0
平均評価: 0.0 / 5
(0 件のレビュー)