Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1481 不均一性を考慮した固化改良地盤の性能評価に関する検討
小林 真貴子, 笠間 清伸 材料 75 1 8–12 2026 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
1482 The effect of normal contact stress on fretting fatigue of ultrafine-grained 6061 aluminum alloy: Experiments and multiscale simulations
Zhanguang Zheng, Yangguang Hao, Zhiwei Dong, Jiabin Yang, Liping Jiang International Journal of Fatigue 204 None 109384–None 2026 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
1483 地盤改良をとりまく近年の話題
勝見 武, 加藤 智大 材料 74 12 787–791 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
1484 Optimization of non-closed multi-cell hexagonal columns generated through topology optimization for enhanced crashworthiness under multiple load angles
VanThanh Dang, Michal Rogala, TrongNhan Tran Structural and Multidisciplinary Optimization 68 12 254–None 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
1485 An efficient modal approach for load-independent topology optimization of compliant mechanisms
Alexander Nowak, L. Flavio Campanile, Alexander Hasse Structural and Multidisciplinary Optimization 68 9 181–None 2025 0.96
平均評価: 0.0 / 5 (0 件のレビュー)
1486 Experimental investigation on the dynamic shear rupture of a novel high-strength and high-toughness steel subjected to high strain rate loading
Yifei Zhu, Xiyue Liu, Shulin Ren, Songyuan Liu, Changyi Yu International Journal of Solids and Structures 326 None 113771–None 2026 0.94
平均評価: 0.0 / 5 (0 件のレビュー)
1487 Fine-Grained Code Clone Detection by Keywords-Based Connection of Program Dependency Graph
Yueming Wu, Wenqi Suo, Siyue Feng, Cong Wu, Deqing Zou, Hai Jin IEEE Transactions on Reliability 74 3 3427–3441 2025 0.94
平均評価: 0.0 / 5 (0 件のレビュー)
1488 MetaMFL: Metamorphic Multiple Fault Localization Without Test Oracles
Lingfeng Fu, Zhenyu Wu, Yan Lei, Meng Yan IEEE Transactions on Reliability 74 3 3236–3250 2025 0.91
平均評価: 0.0 / 5 (0 件のレビュー)
1489 Modeling and Verification of MRSCAN Based on MapReduce Framework
Zhengkang Zuo, Yuhan Ke, Ying Hu, Qing Huang, Zhicheng Zeng, Changjing Wang IEEE Transactions on Reliability 74 3 3311–3325 2025 0.91
平均評価: 0.0 / 5 (0 件のレビュー)