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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
14001 Reliability Evaluation of Phased-Mission Systems Using Stochastic Computation
Peican Zhu, Jie Han, Leibo Liu, Fabrizio Lombardi IEEE Transactions on Reliability 65 3 1612–1623 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14002 Relative Ageing of Series and Parallel Systems With Statistically Independent and Heterogeneous Component Lifetimes
Chen Li, Xiaohu Li IEEE Transactions on Reliability 65 2 1014–1021 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14003 Resilience-Based Component Importance Measures for Critical Infrastructure Network Systems
Yi-Ping Fang, Nicola Pedroni, Enrico Zio IEEE Transactions on Reliability 65 2 502–512 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14004 A Generalized Age Replacement Policy for Systems Under Renewing Repair-Replacement Warranty
Minjae Park, Ki Mun Jung, Dong Ho Park IEEE Transactions on Reliability 65 2 604–612 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14005 A Semi-Geometric Process Model for a Deteriorating System and its Optimal Order-Replacement Policy
Guoqing Cheng, Binghai Zhou, Ling Li IEEE Transactions on Reliability 65 2 582–592 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14006 Classical Optimal Replacement Strategies Revisited
Maxim Finkelstein, Mahmood Shafiee, Anselme N. Kotchap IEEE Transactions on Reliability 65 2 540–546 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14007 Selective Maintenance for Multistate Series Systems With S-Dependent Components
Cuong Duc Dao, Ming J. Zuo IEEE Transactions on Reliability 65 2 525–539 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14008 Condition-Based Maintenance With Scheduling Threshold and Maintenance Threshold
Hai-Kun Wang, Hong-Zhong Huang, Yan-Feng Li, Yuan-Jian Yang IEEE Transactions on Reliability 65 2 513–524 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14009 A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling IEEE Transactions on Reliability 65 1 469–485 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
14010 Multi-Objective and Multi-Stage Reliability Growth Planning in Early Product-Development Stage
Zhaojun Li, Mohammadsadegh Mobin, Thomas Keyser IEEE Transactions on Reliability 65 2 769–781 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)