13041
Detecting and Removing Web Application Vulnerabilities with Static Analysis and Data Mining
Ibéria Medeiros, Nuno Neves, Miguel Correia
IEEE Transactions on Reliability
65
1
54–69
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13042
Multiple Sensor Data Fusion for Degradation Modeling and Prognostics Under Multiple Operational Conditions
Hao Yan, Kaibo Liu, Xi Zhang, Jianjun Shi
IEEE Transactions on Reliability
65
3
1416–1426
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13043
Asymmetric Unscented Transform for Failure Prognosis
Bruno P. Leão, Takashi Yoneyama, João Paulo Pordeus Gomes
IEEE Transactions on Reliability
65
3
1406–1415
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13044
A Novel Hybrid Method of Parameters Tuning in Support Vector Regression for Reliability Prediction: Particle Swarm Optimization Combined With Analytical Selection
Wei Zhao, Tao Tao, Enrico Zio, Wenbin Wang
IEEE Transactions on Reliability
65
3
1393–1405
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13045
Failure Mode and Effect Analysis Under Uncertainty: An Integrated Multiple Criteria Decision Making Approach
Hu-Chen Liu, Jian-Xin You, Ping Li, Qiang Su
IEEE Transactions on Reliability
65
3
1380–1392
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13046
Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal
Anna Richelli, Giovanni Delaini, Marco Grassi, Jean-Michel Redouté
IEEE Transactions on Reliability
65
3
1369–1379
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13047
Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence
Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan
IEEE Transactions on Reliability
65
3
1360–1368
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13048
Parametric Bootstrap Goodness-of-Fit Tests for Imperfect Maintenance Models
Cécile Chauvel, Jean-Yves Dauxois, Laurent Doyen, Olivier Gaudoin
IEEE Transactions on Reliability
65
3
1343–1359
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13049
Optimal Design for Destructive Degradation Tests With Random Initial Degradation Values Using the Wiener Process
Xun Xiao, Zhisheng Ye
IEEE Transactions on Reliability
65
3
1327–1342
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
13050
A Model-Based Method for Remaining Useful Life Prediction of Machinery
Yaguo Lei, Naipeng Li, Szymon Gontarz, Jing Lin, Stanislaw Radkowski, Jacek Dybala
IEEE Transactions on Reliability
65
3
1314–1326
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)