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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
12231 Component Importance Measures for Components With Multiple Dependent Competing Degradation Processes and Subject to Maintenance
Yan-Hui Lin, Yan-Fu Li, Enrico Zio IEEE Transactions on Reliability 65 2 547–557 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12232 Stochastic RUL Calculation Enhanced With TDNN-Based IGBT Failure Modeling
Alireza Alghassi, Suresh Perinpanayagam, Mohammad Samie IEEE Transactions on Reliability 65 2 558–573 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12233 Semi-Markov Model for the Oxidation Degradation Mechanism in Gas Turbine Nozzles
Michele Compare, Fabio Martini, Sara Mattafirri, Fausto Carlevaro, Enrico Zio IEEE Transactions on Reliability 65 2 574–581 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12234 Optimal Replacement of Heterogeneous Items With Minimal Repairs
Ji Hwan Cha IEEE Transactions on Reliability 65 2 593–603 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12235 Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System
Daniel Gil-Tomás, Joaquín Gracia-Morán, J.-Carlos Baraza-Calvo, Luis-J. Saiz-Adalid, Pedro-J. Gil-Vicente IEEE Transactions on Reliability 65 2 648–661 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12236 A Comparative Study of Unknown-Input Observers for Prognosis Applied to an Electromechanical System
David Gucik-Derigny, Rachid Outbib, Mustapha Ouladsine IEEE Transactions on Reliability 65 2 704–717 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12237 Stochastic Comparisons Between Used Systems and Systems Made by Used Components
Nil Kamal Hazra, Asok K. Nanda IEEE Transactions on Reliability 65 2 751–762 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12238 Structure Functions and Minimal Path Sets
Jean-Luc Marichal IEEE Transactions on Reliability 65 2 763–768 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12239 Multi-Objective and Multi-Stage Reliability Growth Planning in Early Product-Development Stage
Zhaojun Li, Mohammadsadegh Mobin, Thomas Keyser IEEE Transactions on Reliability 65 2 769–781 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
12240 Bayesian Estimation and Prediction for a Hybrid Censored Lognormal Distribution
Sukhdev Singh, Yogesh Mani Tripathi IEEE Transactions on Reliability 65 2 782–795 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)