12211
Parametric Bootstrap Goodness-of-Fit Tests for Imperfect Maintenance Models
Cécile Chauvel, Jean-Yves Dauxois, Laurent Doyen, Olivier Gaudoin
IEEE Transactions on Reliability
65
3
1343–1359
2016
1.0
平均評価: 0.0 / 5
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12212
Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence
Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan
IEEE Transactions on Reliability
65
3
1360–1368
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12213
Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal
Anna Richelli, Giovanni Delaini, Marco Grassi, Jean-Michel Redouté
IEEE Transactions on Reliability
65
3
1369–1379
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12214
Failure Mode and Effect Analysis Under Uncertainty: An Integrated Multiple Criteria Decision Making Approach
Hu-Chen Liu, Jian-Xin You, Ping Li, Qiang Su
IEEE Transactions on Reliability
65
3
1380–1392
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12215
A Novel Hybrid Method of Parameters Tuning in Support Vector Regression for Reliability Prediction: Particle Swarm Optimization Combined With Analytical Selection
Wei Zhao, Tao Tao, Enrico Zio, Wenbin Wang
IEEE Transactions on Reliability
65
3
1393–1405
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12216
Asymmetric Unscented Transform for Failure Prognosis
Bruno P. Leão, Takashi Yoneyama, João Paulo Pordeus Gomes
IEEE Transactions on Reliability
65
3
1406–1415
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12217
Multiple Sensor Data Fusion for Degradation Modeling and Prognostics Under Multiple Operational Conditions
Hao Yan, Kaibo Liu, Xi Zhang, Jianjun Shi
IEEE Transactions on Reliability
65
3
1416–1426
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12218
Prognostics Using an Adaptive Self-Cognizant Dynamic System Approach
Guangxing Bai, Pingfeng Wang
IEEE Transactions on Reliability
65
3
1427–1437
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12219
Robust Particle Filters for Fatigue Crack Growth Estimation in Rotorcraft Structures
Mulugeta A. Haile, Jaret C. Riddick, Abey H. Assefa
IEEE Transactions on Reliability
65
3
1438–1448
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
12220
Software Reliability Modeling With Periodic Debugging Schedule
Sudipta Das, Anup Dewanji, Ashis Chakraborty
IEEE Transactions on Reliability
65
3
1449–1456
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)