11431
Automated Bug Report Field Reassignment and Refinement Prediction
Xin Xia, David Lo, Emad Shihab, Xinyu Wang
IEEE Transactions on Reliability
65
3
1094–1113
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11432
Prioritizing Change-Impact Analysis via Semantic Program-Dependence Quantification
Haipeng Cai, Raul Santelices, Siyuan Jiang
IEEE Transactions on Reliability
65
3
1114–1132
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11433
Online Prediction and Improvement of Reliability for Service Oriented Systems
Zuohua Ding, Ting Xu, Tiantian Ye, Yuan Zhou
IEEE Transactions on Reliability
65
3
1133–1148
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11434
A Diversity Model Based on Failure Distribution and its Application in Safety Cases
Luping Chen, John H. R. May
IEEE Transactions on Reliability
65
3
1149–1162
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11435
Formal Verification With Frama-C: A Case Study in the Space Software Domain
Rovedy Aparecida Busquim e Silva, Nanci Naomi Arai, Luciana Akemi Burgareli, Jose Maria Parente de Oliveira, Jorge Sousa Pinto
IEEE Transactions on Reliability
65
3
1163–1179
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11436
Dynamically Discovering Likely Memory Layout to Perform Accurate Fuzzing
Kai Chen, Yingjun Zhang, Peng Liu
IEEE Transactions on Reliability
65
3
1180–1194
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11437
The Use of Security Tactics in Open Source Software Projects
Jungwoo Ryoo, Bryan Malone, Phillip A. Laplante, Priya Anand
IEEE Transactions on Reliability
65
3
1195–1204
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11438
Automated Integration Testing Using Logical Contracts
Dianxiang Xu, Weifeng Xu, Manghui Tu, Ning Shen, William Chu, Chih-Hung Chang
IEEE Transactions on Reliability
65
3
1205–1222
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11439
To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?
Bo Jiang, Peng Chen, Wing Kwong Chan, Xinchao Zhang
IEEE Transactions on Reliability
65
3
1223–1239
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11440
K-Terminal Reliability of d-Trapezoid Graphs
Sudarshan Roy, Krishna Daripa, Alak Kumar Datta
IEEE Transactions on Reliability
65
3
1240–1247
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)