11421
Deviation-Based Obfuscation-Resilient Program Equivalence Checking With Application to Software Plagiarism Detection
Jiang Ming, Fangfang Zhang, Dinghao Wu, Peng Liu, Sencun Zhu
IEEE Transactions on Reliability
65
4
1647–1664
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11422
Characterizing Direct Monitoring Techniques in Software Systems
Marcello Cinque, Domenico Cotroneo, Raffaele Della Corte, Antonio Pecchia
IEEE Transactions on Reliability
65
4
1665–1681
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11423
Eliminating Redundant Bounds Checks in Dynamic Buffer Overflow Detection Using Weakest Preconditions
Yulei Sui, Ding Ye, Yu Su, Jingling Xue
IEEE Transactions on Reliability
65
4
1682–1699
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11424
The Reliability Analysis Based on Subsystems of (n,k) -Star Graph
Xiaowang Li, Shuming Zhou, Xiang Xu, Limei Lin, Dajin Wang
IEEE Transactions on Reliability
65
4
1700–1709
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11425
Construction of a Reliability Structure Function Based on Uncertain Data
Elena Zaitseva, Vitaly Levashenko
IEEE Transactions on Reliability
65
4
1710–1723
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11426
Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Piao Chen, Ancha Xu, Zhi-Sheng Ye
IEEE Transactions on Reliability
65
4
1737–1744
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11427
Cascading Failures on Reliability in Cyber-Physical System
Zuyuan Zhang, Wei An, Fangming Shao
IEEE Transactions on Reliability
65
4
1745–1754
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11428
Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM
Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao
IEEE Transactions on Reliability
65
4
1755–1768
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11429
Some Challenges and Opportunities in Reliability Engineering
Enrico Zio
IEEE Transactions on Reliability
65
4
1769–1782
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
11430
MEMRES: A Fast Memory System Reliability Simulator
Shaodi Wang, Henry Hu, Hongzhong Zheng, Puneet Gupta
IEEE Transactions on Reliability
65
4
1783–1797
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)