1111
RobFace: A Test Suite for Efficient Robustness Evaluation of Face Recognition Systems
Ruihan Zhang, Jun Sun
IEEE Transactions on Reliability
74
3
3615–3628
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1112
Enhancing Fine-Grained Smart Contract Vulnerability Detection Through Domain Features and Transparent Interpretation
Qing Huang, Yu He, Zhenchang Xing, Min Yu, Xiwei Xu, Qinghua Lu
IEEE Transactions on Reliability
74
3
4207–4221
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1113
Inferences on Lifetime Performance Index of Weibull Products Under Step-Stress Setup
Sarat Sindhu Mukhopadhyay, Viswakala K.V., Gijo E.V.
IEEE Transactions on Reliability
74
4
4870–4884
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1114
Prioritizing Vulnerability Assessment Items for IoT Devices Based on Suitability Evaluation Using LLMs
Yuka IKEGAMI, Kento HASEGAWA, Seira HIDANO, Kazuhide FUKUSHIMA, Kazuo ...
IEICE Transactions in Information and Systems
108
12
1556–1569
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1115
A Quantile-Based Approach for Testing Exponentiality Against DMTTF Alternatives
Koushik Das, Shyamal Ghosh
IEEE Transactions on Reliability
74
4
4626–4635
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1116
Bayesian-Driven Optimization of MDCNN-LSTM-RSA: A New Model for Predicting Aeroengine RUL
Wan Anping, Zhang Hua, Khalil Al-Bukhaiti, Xiaomin Cheng, Xiaosheng Ji, Jinglin Wang, Tianmin Shan
IEEE Transactions on Reliability
74
4
5323–5334
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1117
D-Optimal Sample Allocation of the Accelerated Life Tests Under Weibull Series Systems With Type-I Censoring Scheme
Chih-Ying Tai, Tsai-Hung Fan, Chien-Yu Peng
IEEE Transactions on Reliability
74
4
5335–5346
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1118
Availability Modeling and Evaluation of Distributed Topology
Jinbiao Wu, Muhammad Salihu Isa, Ibrahim Yusuf
IEEE Transactions on Reliability
74
4
5633–5646
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1119
UNA: Improving Automated PL-NL System by A Unified Neural Architecture
Dawei Yuan, Tao Zhang, He Jiang
IEEE Transactions on Reliability
74
3
3585–3599
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)
1120
Counterfactual Contrastive Explanations for Software Defect Prediction: Toward Better Model Understanding and Accuracy
Quan-Yi Zou, Zhan-Yu Yang, Xuan-Rui Qiu, Jia-Hong Yu, Yue-Yue Shi, Nuo Chen
IEEE Transactions on Reliability
74
4
5000–5014
2025
0.96
平均評価: 0.0 / 5
(0 件のレビュー)