1081
Probability of Detection for Dependent Observations: The Repeated Measures Method
Christine E. Knott, Christine Schubert Kabban, Eric A. Lindgren
IEEE Transactions on Reliability
74
3
3152–3165
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1082
Concurrent topology optimization method for antenna backframe structure based on fiber-reinforced composites
Jun Song, Shuxin Zhang, Zhaoyang Liu
Structural and Multidisciplinary Optimization
68
11
227–None
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1083
Modeling and Verification of MRSCAN Based on MapReduce Framework
Zhengkang Zuo, Yuhan Ke, Ying Hu, Qing Huang, Zhicheng Zeng, Changjing Wang
IEEE Transactions on Reliability
74
3
3311–3325
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1084
PMBCT: The Probabilistic Multiscale Bayesian Convolutional Transformer for Trustworthy Remaining Useful Life Prediction
Huachao Peng, Zehui Mao, Bin Jiang
IEEE Transactions on Reliability
74
3
3926–3937
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1085
MetaMFL: Metamorphic Multiple Fault Localization Without Test Oracles
Lingfeng Fu, Zhenyu Wu, Yan Lei, Meng Yan
IEEE Transactions on Reliability
74
3
3236–3250
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1086
Fed-OLF: Federated Oversampling Learning Framework for Imbalanced Software Defect Prediction Under Privacy Protection
Xiaowen Hu, Ming Zheng, Rui Zhu, Xuan Zhang, Zhi Jin
IEEE Transactions on Reliability
74
3
3266–3280
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1087
Test Case Generation for Ethereum Smart Contracts Based on Cross-Contract Data Flow Analysis
Xingya Wang, Yumao Yang, Linwei Liu, Zhenyu Chen, Song Huang
IEEE Transactions on Reliability
74
3
3398–3411
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1088
Boosting Identifier Renaming Opportunity Identification via Context-Based Deep Code Representation
Jingxuan Zhang, Zhuhang Li, Jiahui Liang, Zhiqiu Huang
IEEE Transactions on Reliability
74
3
3296–3310
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1089
Applying Lexicographical Ordering to Software Product Line Testing
Tao Li, Chenhui Cui, Yinyin Xu, Rubing Huang
IEEE Transactions on Reliability
74
3
3326–3340
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)
1090
Insights From Bugs in FPGA High-Level Synthesis Tools: An Empirical Study of Bambu Bugs
Zun Wang, He Jiang, Xiaochen Li, Shikai Guo, Xu Zhao, Yi Zhang
IEEE Transactions on Reliability
74
3
3341–3355
2025
0.94
平均評価: 0.0 / 5
(0 件のレビュー)