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アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
10391 Tensor Representation of Topographically Organized Semantic Spaces
Andrés Pomi, Eduardo Mizraji, Juan Lin Neural Computation 30 12 3259–3280 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10392 Multi-Instance Dimensionality Reduction via Sparsity and Orthogonality
Hong Zhu, Li-Zhi Liao, Michael K. Ng Neural Computation 30 12 3281–3308 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10393 Use of a Deep Belief Network for Small High-Level Abstraction Data Sets Using Artificial Intelligence with Rule Extraction
Yoichi Hayashi Neural Computation 30 12 3309–3326 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10394 Limitations of Proposed Signatures of Bayesian Confidence
William T. Adler, Wei Ji Ma Neural Computation 30 12 3327–3354 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10395 Bayesian Modeling of Motion Perception Using Dynamical Stochastic Textures
Jonathan Vacher, Andrew Isaac Meso, Laurent U. Perrinet, Gabriel Peyré Neural Computation 30 12 3355–3392 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10396 Detection of Driver Vigilance Level Using EEG Signals and Driving Contexts
Zizheng Guo, Yufan Pan, Guozhen Zhao, Shi Cao, Jun Zhang IEEE Transactions on Reliability 67 1 370–380 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10397 ConfVD: System Reactions Analysis and Evaluation Through Misconfiguration Injection
Shanshan Li, Wang Li, Xiangke Liao, Shaoliang Peng, Shulin Zhou, Zhouyang Jia, Teng Wang IEEE Transactions on Reliability 67 4 1393–1405 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10398 Evaluation of Mutation Testing in a Nuclear Industry Case Study
Pedro Delgado-Pérez, Ibrahim Habli, Steve Gregory, Rob Alexander, John Clark, Inmaculada Medina-Bulo IEEE Transactions on Reliability 67 4 1406–1419 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10399 A Deductive Method for Diagnostic Analysis of Digital Instrumentation and Control Systems
Jun Yang, Tunc Aldemir, Carol Smidts IEEE Transactions on Reliability 67 4 1442–1458 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
10400 Stochastic Process for the Availability Assessment of Single-Feeder Industrial Energy System Sections
Tom Van Acker, Dirk Van Hertem IEEE Transactions on Reliability 67 4 1459–1467 2018 1.0
平均評価: 0.0 / 5 (0 件のレビュー)