10141
Increasing Validity of Simulation Models Through Metamorphic Testing
Megan Olsen, Mohammad Raunak
IEEE Transactions on Reliability
68
1
91–108
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10142
Mobile GUI Testing Fragility: A Study on Open-Source Android Applications
Riccardo Coppola, Maurizio Morisio, Marco Torchiano
IEEE Transactions on Reliability
68
1
67–90
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10143
Automated Testing of Android Apps: A Systematic Literature Review
Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein
IEEE Transactions on Reliability
68
1
45–66
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10144
Security Testbed for Internet-of-Things Devices
Shachar Siboni, Vinay Sachidananda, Yair Meidan, Michael Bohadana, Yael Mathov, Suhas Bhairav, Asaf Shabtai, Yuval Elovici
IEEE Transactions on Reliability
68
1
23–44
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10145
Toward Better Summarizing Bug Reports With Crowdsourcing Elicited Attributes
He Jiang, Xiaochen Li, Zhilei Ren, Jifeng Xuan, Zhi Jin
IEEE Transactions on Reliability
68
1
2–22
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10146
Imperfect Inspection of a System With Unrevealed Failure and an Unrevealed Defective State
Cristiano A. V. Cavalcante, Philip A. Scarf, M. D. Berrade
IEEE Transactions on Reliability
68
2
764–775
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10147
Optimum Periodic Component Reallocation and System Replacement Maintenance
Yuqiang Fu, Tao Yuan, Xiaoyan Zhu
IEEE Transactions on Reliability
68
2
753–763
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10148
Scheduling Preventive Maintenance Considering the Saturation Effect
Qiuzhuang Sun, Zhi-Sheng Ye, Weiwen Peng
IEEE Transactions on Reliability
68
2
741–752
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10149
A Comprehensive Survey of Prognostics and Health Management Based on Deep Learning for Autonomous Ships
André Listou Ellefsen, Vilmar Æsøy, Sergey Ushakov, Houxiang Zhang
IEEE Transactions on Reliability
68
2
720–740
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10150
A Class of Mappings for Assessment of Aircraft Pneumatic Actuator Degradation Parameters
Júlio César Graves, Wallace Hessler Leal Turcio, Takashi Yoneyama
IEEE Transactions on Reliability
68
2
710–719
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)