10131
A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes
Mengfei Fan, Zhiguo Zeng, Enrico Zio, Rui Kang, Ying Chen
IEEE Transactions on Reliability
68
1
317–329
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10132
A Novel Multistate Minimal Cut Vectors Problem and Its Algorithm
Zhifeng Hao, Wei-Chang Yeh, Cheng-Feng Hu
IEEE Transactions on Reliability
68
1
291–301
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10133
Design and Evaluation of Algorithms for Energy Efficient and Complete Determination of Critical Nodes for Wireless Sensor Network Reliability
Orhan Dagdeviren, Vahid Khalilpour Akram, Bulent Tavli
IEEE Transactions on Reliability
68
1
280–290
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10134
An Approach for the Prediction of Number of Software Faults Based on the Dynamic Selection of Learning Techniques
Santosh Singh Rathore, Sandeep Kumar
IEEE Transactions on Reliability
68
1
216–236
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10135
Start-Up Demonstration Tests With the Intent of Equipment Classification for Balanced Systems
Xian Zhao, Xiaoyue Wang, David W. Coit, Yuan Chen
IEEE Transactions on Reliability
68
1
161–174
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10136
Identification of Cascading Failure Initiated by Hidden Multiple-Branch Contingency
Liang Che, Xuan Liu, Yunfeng Wen, Zuyi Li
IEEE Transactions on Reliability
68
1
149–160
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10137
Type Learning for Binaries and Its Applications
Zhiwu Xu, Cheng Wen, Shengchao Qin
IEEE Transactions on Reliability
68
3
893–912
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10138
A Reliability Model for Dependent and Distributed MDS Disk Array Units
Suayb S. Arslan
IEEE Transactions on Reliability
68
1
133–148
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10139
q-Weibull Applied to Brazilian Hydropower Equipment
Edilson Machado de Assis, Gabriel A. Costa Lima, Augusto Prestes, Fernanda Marinho, Luís Augusto Nagasaki Costa
IEEE Transactions on Reliability
68
1
122–132
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
10140
Modeling the Ageing Effect of Cycling Using a Supercapacitor-Module Under High Temperature With Electrochemical Impedance Spectroscopy Test
Hadiza Ahmad, Wong Yee Wan, Dino Isa
IEEE Transactions on Reliability
68
1
109–121
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)