PoFINN: Integrating Physics of Failure and Neural Networks for Long-Term Degradation Forecasting of Aluminum Electrolytic Capacitors
['Anindya Bhattacharyya', 'Anurag Dutta', 'Rajendra Prasad Behera', 'Arup Dasgupta', 'Rajat Subhra Chakraborty']
/
IEEE Transactions on Reliability
/ Vol. 74
/ No. 4