In situ monitoring and ex situ TEM analyses of spinel (MgAl\(_2\)O\(_4\)) growth between (111)-oriented periclase (MgO) substrates and Al\(_2\)O\(_3\) thin films
['L. C. Götze', 'R. Milke', 'R. Wirth']
/
Journal of Materials Science
/ Vol. 51
/ No. 19
0.0 / 5
0
Reviews
You must log in to post, edit and delete a review.
Log in
Earn 50 points when your review is published.
About KnowledgeRank Points
No reviews have been posted yet. Be the first to write one!