Microstructure and strength of AlN–SiC interface studied by synchrotron X-rays
['T. S. Argunova', 'M. Yu. Gutkin', 'E. N. Mokhov']
/
Journal of Materials Science
/ Vol. 52
/ No. 8
0.0 / 5
0
Reviews
You must log in to post, edit and delete a review.
Log in
Earn 50 points when your review is published.
About KnowledgeRank Points
No reviews have been posted yet. Be the first to write one!