A nanoclustered ceria abrasives with low crystallinity and high Ce3+/Ce4+ ratio for scratch reduction and high oxide removal rates in the chemical mechanical planarization
['Na-Yeon Kim', 'Goeun Kim', 'Jae-Do Nam']
/
Journal of Materials Science
/ Vol. 57
/ No. 26
まだレビューは投稿されていません。あなたが最初のレビューを書きませんか?