Distributions and Causation Probabilities of Multiple-Run-Rules and Their Applications in System Reliability, Quality Control, and Start-Up Tests
['Winnie H. Fu', 'Wan-Chen Lee', 'James C. Fu']
/
IEEE Transactions on Reliability
/ Vol. 65
/ No. 3
まだレビューは投稿されていません。あなたが最初のレビューを書きませんか？