Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach
['Fei Wu', 'Xiao-Yuan Jing', 'Ying Sun', 'Jing Sun', 'Lin Huang', 'Fangyi Cui', 'Yanfei Sun']
/
IEEE Transactions on Reliability
/ Vol. 67
/ No. 2
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