Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures
['Tian CHEN', 'Dandan SHEN', 'Xin YI', 'Huaguo LIANG', 'Xiaoqing WEN', 'Wei WANG']
/
IEICE Transactions on Information and Systems
/ Vol. 99
/ No. 11
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