Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device
['Xihong ZHOU', 'Senling WANG', 'Yoshinobu HIGAMI', 'Hiroshi TAKAHASHI']
/
IEICE Transactions on Information and Systems
/ Vol. 107
/ No. 1
0.0 / 5
0
Reviews
You must log in to post, edit and delete a review.
Log in
Earn 50 points when your review is published.
About KnowledgeRank Points
No reviews have been posted yet. Be the first to write one!