In-situ Two-dimensional Characterization for Uniformity of Au/Ni/n-β-Ga2O3 Schottky Contacts under Applying Voltage by Scanning Internal Photoemission Microscopy
['Hiroki IMABAYASHI', 'Hitose SAWAZAKI', 'Kohei SASAKI', 'Kenji SHIOJIMA']
/
Journal of the Society of Materials Science, Japan
/ Vol. 75
/ No. 3
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