Toward Robust Monitoring of Exponential Processes: A Memory‐Driven Scheme for Zero‐ and Steady‐State Scenarios
['Muhammad Arslan', 'Syed Masroor Anwar', 'Huiming Zhu', 'Naif Almakayeel', 'Chang‐Yun Lin', 'Majid Khan']
/
Quality and Reliability Engineering International
/ Vol. 42
/ No. 3
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