A novel approach for remaining useful life prediction of high‐reliability equipment based on long short‐term memory and multi‐head self‐attention mechanism
['Sameer Al‐Dahidi', 'Mohammad Rashed', 'Mohammad Abu‐Shams', 'Mohamed Arezki Mellal', 'Mohammad Alrbai', 'Saleem Ramadan', 'Enrico Zio']
/
Quality and Reliability Engineering International
/ Vol. 40
/ No. 2
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