Reliability inference for VGA adapter from dual suppliers based on contaminated type‐I interval‐censored data
['Tzong‐Ru Tsai', 'Hon Keung Tony Ng', 'Hoang Pham', 'Yuhlong Lio', 'Jyun‐You Chiang']
/
Quality and Reliability Engineering International
/ Vol. 35
/ No. 7
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