Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test
['Jianping Zhang', 'Yu Zong', 'Xing Zhang', 'Guoliang Cheng', 'Beiwen Jin']
/
Quality and Reliability Engineering International
/ Vol. 35
/ No. 1
0.0 / 5
0
Reviews
You must log in to post, edit and delete a review.
Log in
Earn 50 points when your review is published.
About KnowledgeRank Points
No reviews have been posted yet. Be the first to write one!