A global scheme for controlling the mean and standard deviation of a process based on the optimal design of gauges
['Jaime Mosquera', 'Francisco Aparisi', 'Eugenio Kahn Epprecht']
/
Quality and Reliability Engineering International
/ Vol. 34
/ No. 5
まだレビューは投稿されていません。あなたが最初のレビューを書きませんか?