Reliability Estimation for Products Subjected to Two‐Stage Degradation Tests Based on a Gamma Convolution
['Luis Alberto Rodríguez‐Picón', 'Luis Carlos Méndez‐González', 'Manuel Iván Rodríguez Borbón', 'Arturo Del Valle']
/
Quality and Reliability Engineering International
/ Vol. 32
/ No. 8
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