Bayesian framework for fault variable identification
['Mehmet Turkoz', 'Sangahn Kim', 'Young-Seon Jeong', 'Myong K. (MK) Jeong', 'Elsayed A. Elsayed', 'Khalifa N. Al-Khalifa', 'Abdel Magid Hamouda']
/
Journal of Quality Technology
/ Vol. 51
/ No. 4
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